SDL and MSC Based Test Generation for Distributed Test Architectures

Most of the SDL and MSC based test generation methods and tools produce non-concurrent TTCN test cases only. If the test equipment itself is a distributed system, the implementation of such test cases is a difficult task and requires a substantial amount of additional work. In this paper, we explain how concurrent TTCN test cases can be generated directly from SDL system specifications and MSC test purposes. To do this, explicit synchronization points have to be indicated in the MSC test purposes, and information about the existing test components and their connections has to be provided.