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Search All Publications
Articles in Conference Proceedings
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Dieter Hogrefe, Beat Koch, Helmut NeukirchenSome Implications of MSC, SDL and TTCN Time Extensions for Computer-aided Test Generation, Proceedings of the 10th SDL-Forum, 2001
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Paul Baker, Jens Grabowski, Ekkart Rudolph, Ina SchieferdeckerA Message Sequence Chart-profile for Graphical Test Specification, Development and Tracing, Proceedings of the 18th International Conference and Ex-position on Testing Computer Software, 2001
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Dirk Thißen, Helmut NeukirchenIntegrating Trading and Load Balancing for Efficient Management of Services in Distributed Systems, Proceedings of the 3rd IFIP/GI International Conference on Trends towards a Universal Service Market (USM 2000), 2000
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Jens Grabowski, Anthony Wiles, Colin Willcock, Dieter HogrefeOn the Design of the new Testing Language TTCN-3, 13th IFIP International Workshop on Testing Communicating Systems (Testcom 2000),, 2000
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Dirk Thißen, Helmut NeukirchenManaging Services in Distributed Systems by Integrating Trading and Load Balancing, Proceedings of the 5th IEEE Symposium on Computers and Communications (ISCC 2000), 2000
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Michael Schmitt, Michael Ebner, Jens GrabowskiTest Generation with Autolink and TestComposer, Proceedings of the 2nd Workshop of the SDL Forum Society on SDL and MSC (SAM'2000), 2000
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Ekkart Rudolph, Ina Schieferdecker, Jens GrabowskiHyperMSC - a Graphical Representation of TTCN, Proceedings of the 2nd Workshop of the SDL Forum Society on SDL and MSC (SAM'2000), 2000
- TTCN-3 -- A new Test Specification Language for Black-Box Testing of Distributed Systems, Proceedings of the 17th International Conference and Exposition on Testing Computer Software (TCS 2000), 2000
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Ekkart Rudolph, Ina Schieferdecker, Jens GrabowskiDevelopment of an MSC/UML Test Format, Formale Beschreibungstechniken für verteilte Systeme, 2000
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Jens Grabowski, Dieter HogrefeTTCN SDL- and MSC-based specification and automated test case generation for INAP, Proceedings of the 8th International Conference on Telecommunication Systems (ICTS'2000) - Modeling and Analysis, 2000
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